Rupich M.W., Aytug T., Leonard K.J., Zhang Y., Gapud A.A., Khan A., III F.A., Greenwood N.T., Alexander J.A.
Aytug T., Christen D.K., Paranthaman M.P., Leonard K.J., Thompson J.R., Xiong X., Selvamanickam V., Wee S.H., Zuev Y.L., Polat O., Sinclair J.W., Ertugrul M.
Miller D.J., Maroni V.A., Specht E.D., Chen Z., Aytug T., Paranthaman M.P., Zuev Y., Kropf A.J., Zaluzec N.J.
Miller D.J., Maroni V.A., Specht E.D., Paranthaman M., Aytug T., Cantoni C., Zhang Y., Zuev Y., Kropf A.J., Chen Z.*21, Zaluzec N.
Paranthaman M., Aytug T., Christen D.K., Thompson J.R., Kim K., Selvamanickam V., Polat O., Qiu X., Lupini A.R., Meyer H.M.
Ключевые слова: presentation, HTS, YBCO, coated conductors, IBAD process, MOCVD process, commercialization, long conductors, fabrication, roughness, planarization, texture, substrate Hastelloy, microstructure, irradiation effects, growth rate, defects, pinning, critical caracteristics, critical current density, angular dependence, Jc/B curves, nanoscaled effects, nanodots, phase composition, defects columnar, homogeneity, critical current, thickness dependence
Maroni V.A., Goyal A., Specht E.D., Paranthaman M., Aytug T., Christen D.K., Kim K., Cantoni C., Zhang Y., Selvamanickam V., Chen Y., Zuev Y.L.
Maroni V.A., Goyal A., Paranthaman M., Aytug T., Heatherly L., Kim K., Zhang Y., Selvamanickam V., Chen Y., Zuev Y.
Ключевые слова: HTS, YBCO, coated conductors, MOCVD process, IBAD process, fabrication
Ключевые слова: HTS, YBCO, coated conductors, MOCVD process, IBAD process, fabrication, buffer layers, critical caracteristics, doping effect, pilot-scale, presentation
Ключевые слова: presentation, HTS, YBCO, coated conductors, fabrication, MOCVD process, IBAD process, buffer layers, substrate Hastelloy, roughness, critical caracteristics, Jc/B curves, angular dependence, doping effect, microstructure, long conductors, coils pancake, critical current, pilot-scale, homogeneity
Ключевые слова: patents, chemical solution deposition, fabrication, template layers, texture, HTS, coated conductors, YBCO
Goyal A., Paranthaman M., Lee D., Aytug T., Cantoni C., Zhang Y., Selvamanickam V., Chen Y., Zuev Y., Specht E.
Goyal A., Specht E.D., Aytug T., Christen D.K., Paranthaman M.P., Thompson J.R., Cantoni C., Zhang Y., Selvamanickam V., Chen Y., Zuev Y.L., Sinclair J.W.
Ключевые слова: cryogenic systems, dielectrics, breakdown characteristics, experimental results
Ключевые слова: patents, HTS, coated conductors, buffer layers, fabrication, YBCO, substrate Ni-W, Jc/B curves, critical caracteristics
Ключевые слова: HTS, YBCO, coated conductors, MOCVD process, IBAD process, buffer layers, nanoscaled effects, template layers, long conductors, capacity, fabrication, microstructure, Jc/B curves, doping effect, REBCO, angular dependence, pinning force, texture, current-voltage characteristics, critical current, homogeneity, thickness dependence, presentation, critical caracteristics
Ключевые слова: HTS, YBCO, coated conductors, MOCVD process, fabrication, IBAD process, funding, pilot-scale, template layers, pinning, REBCO, high rate process, plans, collaborations, presentation
Paranthaman M., Aytug T., Christen D.K., Leonard K.J., Thompson J.R., Kim K., Zhang Y., Ijaduola A.O., Tuncer E.
Ключевые слова: presentation, HTS, YBCO, coated conductors, IBAD process, MOCVD process, fabrication, microstructure, buffer layers, high rate process, critical current, thickness dependence, oxygenation treatments, REBCO, magnetic field dependence, critical current density, Jc/B curves, angular dependence, texture, nanodots, pinning, critical caracteristics
Rupich M.W., Li X., Zhang W., Kodenkandath T., Goyal A., Aytug T., Paranthaman M.P., Leonard K.J., Sathyamurthy S., Bhuiyan M.S., Kim K., Martin P.M., Li J., Fayek M.
Paranthaman M., Aytug T., Leonard K.J., Sathyamurthy S., Bhuiyan M.S., Kang S., Martin P.M., Hunt R.D.
Ключевые слова: solution techniques, nanoscaled effects, HTS, YBCO, nanodoping, pinning, fabrication, Jc/B curves, critical caracteristics
Paranthaman M., Aytug T., Christen D.K., Thompson J.R., Kang S., Martin P.M., Varela M., Gapud A.A., Raitano J.M., Chan S.-W.
Ключевые слова: HTS, YBCO, films, substrate SrTiO3, buffer layers, nanoscaled effects, surface, pinning, Jc/B curves, angular dependence, critical current density, critical caracteristics
Goyal A., Paranthaman M., Aytug T., Christen D.K., Heatherly L., Leonard K.J., Thompson J.R., Kang S., Martin P.M., Ijaduola A.O., Rusakova I., Meng R., Chu C.W.(cwchu@uh.edu)
Ключевые слова: HTS, YBCO, films, substrate metallic, substrate single crystal, nanoscaled effects, nanoscaled roughness, pinning, Jc/B curves, temperature dependence, pinning force, irreversibility fields, angular dependence, microstructure, experimental results, critical caracteristics, magnetic properties
Ключевые слова: patents, HTS, coated conductors, substrate metallic, REBCO, other HTS, buffer layers, magnetron sputtering, cap layers, PLD process, fabrication
Aytug T., Christen D.K., Feenstra R., Zhang Y.(zhanngyf@utk.edu), ParansParanthaman M.
Ключевые слова: HTS, YBCO, films, substrate single crystal, precursors, TFA-MOD process, fluorine process, Jc/B curves, fabrication, experimental results, critical caracteristics
Goyal A., Paranthaman M., Aytug T., Christen D.K., Leonard K.J., Thompson J.R., Martin P.M., Zhai H.Y., Gapud A.A.
Ключевые слова: HTS, YBCO, coated conductors, RABITS process, seed layers, barriers, oxygen diffusion, Jc/B curves, fabrication, critical caracteristics
Rupich M.W., Thieme C., Li X., Kodenkandath T., Goyal A., Paranthaman M., Aytug T., Christen D.K., Budai J.D., Cantoni C., Gapud A.A., Schoop U.(uschoop@amsuper.com), Kim K.(kyz@ornl.gov)
Goyal A., Aytug T., Christen D.K., Paranthaman M.P., Cantoni C., Gapud A.A., Kim K.(kkim@mse.ufl.edu), Norton D.P.
Ключевые слова: HTS, YBCO, coated conductors, buffer layers, PLD process, substrate SrTiO3, texture, resistivity, temperature dependence, fabrication
Goyal A., Paranthaman M., Christen D.K., Leonard K.J., Thompson J.R., Martin P.M., Zhai H.Y., Aytug T.(aytugt@ornl.gov), Gapud A.A.
Goyal A., Paranthaman M., Aytug T., Salama K., Sathyamurthy S., Bhuiyan M.S., Kang S., Lee D.F., Payzant E.A.
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni-W, buffer layers, MOD process, microstructure, experimental results, fabrication, magnetic properties
Rupich M.W., Schoop U., Thieme C., Zhang W., Kodenkandath T., Nguyen N., Arendt P.N., Foltyn S.R., Verebelyi D.T., Li X.(xli@amsuper.com), Jowett M., Holesinger T.G., Aytug T., Christen D.K., Paranthaman M.P.
Arendt P.N., Foltyn S.R., DePaula R.F., Stan L., Groves J.R., Holesinger T.G., Aytug T., Christen D.K., Paranthaman M.P., Kang S., Feenstra R., Budai J.D.
Aytug T., Paranthaman M., Kang S., Zhai H.Y., Leonard K.J., Vallet C.E., Sathyamurthy S., Christen H.M., Goyal A., Christen D.K.
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